X-ray Metrology for Micron-thick Multilayer 3D-DRAM

Il y a 3 jours

VlaamsBrabant, Vlaams-Brabant, Belgique Imec Temps plein 12 000 € - 18 000 € Contrat

Imec invites a Master student to join our metrology team for an internship focused on advanced X-ray techniques to characterize micron-thick multilayer stacks used in future memory devices. You will work with XRR, HR-XRD, GISAXS and diffuse scattering to quantify layer thickness, periodicity and interface quality, benchmarking against TEM.

The project includes analyzing spectra from ONO and Si/SiGe samples, exploring correlations between growth, morphology, and 3D memory scaling.